Ultraviolet electroluminescence from randomly assembled n -SnO2 nanowires p -GaN:Mg Heterojunction

H. Y. Yang, S. F. Yu, H. K. Liang, S. P. Lau, S. S. Pramana, C. Ferraris, C. W. Cheng, H. J. Fan

Research output: Contribution to journalArticlepeer-review

45 Citations (Scopus)

Abstract

Electroluminescence characteristics of a heterojunction light-emitting diode, which was fabricated by depositing a layer of randomly assembled n-SnO2 nanowires on p-GaN:Mg/sapphire substrate via vapor transport method, were investigated at room temperature. Peak wavelength emission at around 388 nm was observed for the diode under forward bias. This is mainly related to the radiative recombination of weakly bounded excitons at the shallow-trapped states of SnO2 nanowires, Under reverse bias, near bandedge emission from the p-GaN:Mg/sapphire leads to the observation of emission peak at around 370 nm.

Original languageEnglish
Pages (from-to)1191-1194
Number of pages4
JournalACS Applied Materials and Interfaces
Volume2
Issue number4
DOIs
Publication statusPublished - Apr 28 2010
Externally publishedYes

ASJC Scopus Subject Areas

  • General Materials Science

Keywords

  • Defect state recombination
  • Light-emitting diodes
  • SnO nanowires
  • Ultraviolet emission

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