Understanding the electrical transport properties of carbon nanotubes and its metal under-layers

D. L. Tan; C. C. Yap; X. C. Li; J. Wei; D. Baillargeat; B. K. Tay

doi:10.1109/EPTC.2011.6184395

Understanding the electrical transport properties of carbon nanotubes and its metal under-layers

D. L. Tan^*, C. C. Yap, X. C. Li, J. Wei, D. Baillargeat, B. K. Tay

^*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

Carbon nanotubes have been widely studied due to its excellent electrical, thermal and mechanical properties, showing promising applications in both active and passive components in electronic devices. However, for such devices to be developed, compatibility issues for obtaining quality carbon nanotubes with suitable underlying substrates have to be understood. In this work, a technique to study the impact of each under layer on carbon nanotubes would be discussed. Vertically aligned multiwalled carbon nanotubes are grown on patterned metal trace with suitable barrier layers. In situ electrical measurement of the nanotubes using manipulators in a field emission scanning electron microscope was performed to understand the electrical transport at each interface.

Original language	English
Title of host publication	2011 IEEE 13th Electronics Packaging Technology Conference, EPTC 2011
Pages	104-107
Number of pages	4
DOIs	https://doi.org/10.1109/EPTC.2011.6184395
Publication status	Published - 2011
Externally published	Yes
Event	2011 IEEE 13th Electronics Packaging Technology Conference, EPTC 2011 - Singapore, Singapore Duration: Dec 7 2011 → Dec 9 2011

Publication series

Name	2011 IEEE 13th Electronics Packaging Technology Conference, EPTC 2011

Conference

Conference	2011 IEEE 13th Electronics Packaging Technology Conference, EPTC 2011
Country/Territory	Singapore
City	Singapore
Period	12/7/11 → 12/9/11

ASJC Scopus Subject Areas

Electrical and Electronic Engineering

Access to Document

10.1109/EPTC.2011.6184395

Cite this

Tan, D. L., Yap, C. C., Li, X. C., Wei, J., Baillargeat, D., & Tay, B. K. (2011). Understanding the electrical transport properties of carbon nanotubes and its metal under-layers. In 2011 IEEE 13th Electronics Packaging Technology Conference, EPTC 2011 (pp. 104-107). Article 6184395 (2011 IEEE 13th Electronics Packaging Technology Conference, EPTC 2011). https://doi.org/10.1109/EPTC.2011.6184395

@inproceedings{f97a5d846c464d95836a5ee48d485fbd,

title = "Understanding the electrical transport properties of carbon nanotubes and its metal under-layers",

abstract = "Carbon nanotubes have been widely studied due to its excellent electrical, thermal and mechanical properties, showing promising applications in both active and passive components in electronic devices. However, for such devices to be developed, compatibility issues for obtaining quality carbon nanotubes with suitable underlying substrates have to be understood. In this work, a technique to study the impact of each under layer on carbon nanotubes would be discussed. Vertically aligned multiwalled carbon nanotubes are grown on patterned metal trace with suitable barrier layers. In situ electrical measurement of the nanotubes using manipulators in a field emission scanning electron microscope was performed to understand the electrical transport at each interface.",

author = "Tan, {D. L.} and Yap, {C. C.} and Li, {X. C.} and J. Wei and D. Baillargeat and Tay, {B. K.}",

year = "2011",

doi = "10.1109/EPTC.2011.6184395",

language = "English",

isbn = "9781457719837",

series = "2011 IEEE 13th Electronics Packaging Technology Conference, EPTC 2011",

pages = "104--107",

booktitle = "2011 IEEE 13th Electronics Packaging Technology Conference, EPTC 2011",

note = "2011 IEEE 13th Electronics Packaging Technology Conference, EPTC 2011 ; Conference date: 07-12-2011 Through 09-12-2011",

}

Tan, DL, Yap, CC, Li, XC, Wei, J, Baillargeat, D & Tay, BK 2011, Understanding the electrical transport properties of carbon nanotubes and its metal under-layers. in 2011 IEEE 13th Electronics Packaging Technology Conference, EPTC 2011., 6184395, 2011 IEEE 13th Electronics Packaging Technology Conference, EPTC 2011, pp. 104-107, 2011 IEEE 13th Electronics Packaging Technology Conference, EPTC 2011, Singapore, Singapore, 12/7/11. https://doi.org/10.1109/EPTC.2011.6184395

Understanding the electrical transport properties of carbon nanotubes and its metal under-layers. / Tan, D. L.; Yap, C. C.; Li, X. C. et al.
2011 IEEE 13th Electronics Packaging Technology Conference, EPTC 2011. 2011. p. 104-107 6184395 (2011 IEEE 13th Electronics Packaging Technology Conference, EPTC 2011).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

TY - GEN

T1 - Understanding the electrical transport properties of carbon nanotubes and its metal under-layers

AU - Tan, D. L.

AU - Yap, C. C.

AU - Li, X. C.

AU - Wei, J.

AU - Baillargeat, D.

AU - Tay, B. K.

PY - 2011

Y1 - 2011

N2 - Carbon nanotubes have been widely studied due to its excellent electrical, thermal and mechanical properties, showing promising applications in both active and passive components in electronic devices. However, for such devices to be developed, compatibility issues for obtaining quality carbon nanotubes with suitable underlying substrates have to be understood. In this work, a technique to study the impact of each under layer on carbon nanotubes would be discussed. Vertically aligned multiwalled carbon nanotubes are grown on patterned metal trace with suitable barrier layers. In situ electrical measurement of the nanotubes using manipulators in a field emission scanning electron microscope was performed to understand the electrical transport at each interface.

AB - Carbon nanotubes have been widely studied due to its excellent electrical, thermal and mechanical properties, showing promising applications in both active and passive components in electronic devices. However, for such devices to be developed, compatibility issues for obtaining quality carbon nanotubes with suitable underlying substrates have to be understood. In this work, a technique to study the impact of each under layer on carbon nanotubes would be discussed. Vertically aligned multiwalled carbon nanotubes are grown on patterned metal trace with suitable barrier layers. In situ electrical measurement of the nanotubes using manipulators in a field emission scanning electron microscope was performed to understand the electrical transport at each interface.

UR - http://www.scopus.com/inward/record.url?scp=84860909917&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84860909917&partnerID=8YFLogxK

U2 - 10.1109/EPTC.2011.6184395

DO - 10.1109/EPTC.2011.6184395

M3 - Conference contribution

AN - SCOPUS:84860909917

SN - 9781457719837

T3 - 2011 IEEE 13th Electronics Packaging Technology Conference, EPTC 2011

SP - 104

EP - 107

BT - 2011 IEEE 13th Electronics Packaging Technology Conference, EPTC 2011

T2 - 2011 IEEE 13th Electronics Packaging Technology Conference, EPTC 2011

Y2 - 7 December 2011 through 9 December 2011

ER -

Understanding the electrical transport properties of carbon nanotubes and its metal under-layers

Abstract

Publication series

Conference

ASJC Scopus Subject Areas

Access to Document

Other files and links

Fingerprint

Cite this