Vectorial, high numerical aperture study of Nomarski's differential interference contrast microscope

Peter R.T. Munro; Peter Török

doi:10.1364/OPEX.13.006833

Vectorial, high numerical aperture study of Nomarski's differential interference contrast microscope

Peter R.T. Munro^*, Peter Török

^*Corresponding author for this work

Imperial College London

Research output: Contribution to journal › Article › peer-review

27 Citations (Scopus)

Abstract

It is well known that vectorial analysis is essential to the study of high numerical aperture (NA) bright field scanning microscopes. We have constructed a high NA, vectorial model of a scanned Differential Interference Contrast (DIC) microscope which demonstrates that vectorial analysis is even more important to the study of this device. Our model is valid for coherent illumination and is able to model arbitrary scattering objects through the application of rigorous numerical methods for calculating electromagnetic scattering. We use our model to demonstrate how parameters such as sheer and bias affect imaging properties of both confocal and conventional scanning type DIC microscopes.

Original language	English
Pages (from-to)	6833-6847
Number of pages	15
Journal	Optics Express
Volume	13
Issue number	18
DOIs	https://doi.org/10.1364/OPEX.13.006833
Publication status	Published - Sept 5 2005
Externally published	Yes

ASJC Scopus Subject Areas

Atomic and Molecular Physics, and Optics

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10.1364/OPEX.13.006833

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Vectorial, high numerical aperture study of Nomarski's differential interference contrast microscope

Abstract

ASJC Scopus Subject Areas

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