Visualizing charge transport in silicon nanocrystals embedded in SiO 2 films with electrostatic force microscopy

C. Y. Ng, T. P. Chen*, H. W. Lau, Y. Liu, M. S. Tse, O. K. Tan, V. S.W. Lim

*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

45 Citations (Scopus)

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Chemical Engineering