Wafer-Level Fabrication and Gas Sensing Properties of miniaturized gas sensors based on Inductively Coupled Plasma Deposited Tin Oxide Nanorods

A. Forleo*, L. Francioso, S. Capone, F. Casino, P. Siciliano, O. K. Tan, H. Hui

*Corresponding author for this work

Research output: Contribution to journalConference articlepeer-review

10 Citations (Scopus)

Abstract

SnO2 nanorods were successfully deposited on 3" Si/SiO2 wafers by inductively coupled plasma-enhanced chemical vapor deposition (PECVD) and a wafer-level patterning of nanorods layer for miniaturized solid state gas sensor fabrication were performed. Uniform needle-shape SnO2 nanorods in situ grown were obtained under catalyst- and high temperature treatment-free growth condition. These nanorods have an average diameter between 5 and 15 nm and a length of 160 to 300 nm. The SnO2-nanords based gas sensors were tested towards NH3 and CH3OH and gas sensing tests show remarkable response, showing promising and repeatable results compared with the SnO2 thin films gas sensors.

Original languageEnglish
Pages (from-to)196-199
Number of pages4
JournalProcedia Chemistry
Volume1
Issue number1
DOIs
Publication statusPublished - Sept 2009
Externally publishedYes
EventEurosensors 23rd Conference - Lausanne, Switzerland
Duration: Sept 6 2009Sept 9 2009

ASJC Scopus Subject Areas

  • General Chemistry
  • General Chemical Engineering

Keywords

  • Gas sensors
  • Nanorods
  • plasma-enhanced chemical vapor deposition (PECVD)
  • SnO

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