X-ray residual stress measurement in films with crystallographic texture and grain shape

L. G. Yu*, B. C. Hendrix, K. W. Xu, J. W. He, H. C. Gu

*Corresponding author for this work

Research output: Contribution to journalConference articlepeer-review

2 Citations (Scopus)

Fingerprint

Dive into the research topics of 'X-ray residual stress measurement in films with crystallographic texture and grain shape'. Together they form a unique fingerprint.

Engineering

Material Science

Keyphrases

Chemical Engineering