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Pyramidal structural defects in erbium silicide thin films
Eu Jin Tan, Mathieu Bouville, Dong Zhi Chi*, Kin Leong Pey, Pooi See Lee, David J. Srolovitz, Chih Hang Tung
*Corresponding author for this work
Research output: Contribution to journal › Article › peer-review
20
Citations
(Scopus)