Fingerprint
Dive into the research topics of 'The analysis of dielectric breakdown in Cu/low-k interconnect system'. Together they form a unique fingerprint.- Sort by
- Weight
- Alphabetically
The analysis of dielectric breakdown in Cu/low-k interconnect system
Nam Hwang*, Tam Lyn Tan, Kuo Cheng, An Yan Du, Chee Lip Gan, Dim Lee Kwong
*Corresponding author for this work
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution